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The 2nd Workshop on NanoTechnology Transfer in Europe
December 13, 2006 | Hotel Mercure Paris Montmartre | Paris, France Hosted by European Nano Systems 2006

  Paul Scherrer Institut (PSI) 

Contact Organization

     X-ray phase contrast imaging

Technology Description

A novel non-destructive testing method based on microfabricated diffraction gratings using either high brilliance X-rays from a synchrotron source or conventional X-rays from an X-ray tube allows the direct imaging of the phase contrast in the X-ray beam induced by the object under investigation.

Applications / use-cases:

Medical investigations, particularly cancer diagnosis.
Non destructive materials investigations and testing.
Inspection systems for production.
Safety inspection of e.g. luggage at airports.

Advantages over current alternatives:

Higher sensitivity over classical absorption contrast methods.
Better selectivity between different materials

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TECH TRANSFER SPACE

 U.C. Davis
Innovation Access
Nano-biology
Nano-chips
Nano-detectors
Nano-structured Materials

 University of Washington
Shear-Induced Nanoscale Binding Switches
Microfabricated thermocouples …
Electrospinning of Hollow Nanofibers…

Molecular Imprints

Nanoaracat

Fraunhofer Technology Development Group TEG

Metamorphose Virtual Institute

 IMEL/NCSR Demokritos

 Paul Scherrer Institut (PSI)
Nano-imprint technology
EUV interference lithography
X-ray phase contrast imaging

 Centre Suisse d' Electronique et de Microtechnique (CSEM)
Nanostructuring Technologies

Nanotools
Engineering for Life Sciences

 Optoelectronics Research Centre Tampere University of Technology
Nanoimprint Lithography …

 VITO

 Yissum- The Technology Transfer Company of the Hebrew University

Micro@Nanofabrication - Austria

 NCCR, University of Basel

 Tyndall National Institute

 Laboratory for Thin Films Nanosystems & Nanometrology (LTFN) "NANONET" Network Aristotle University of Thessaloniki

 CERICOL

 XLab – Politecnico di Torino

 Carbon Group - Politecnico di Torino

 Departament d'Enginyeria Electrònica, Universitat Autonoma de Barcelona