Paul Scherrer Institut (PSI)
|  |
X-ray phase contrast imaging |
Technology Description
A novel non-destructive testing method based on microfabricated diffraction gratings using either high brilliance X-rays from a synchrotron source or conventional X-rays from an X-ray tube allows the direct imaging of the phase contrast in the X-ray beam induced by the object under investigation.
Applications / use-cases:
Medical investigations, particularly cancer diagnosis.
Non destructive materials investigations and testing.
Inspection systems for production.
Safety inspection of e.g. luggage at airports.
Advantages over current alternatives:
Higher sensitivity over classical absorption contrast methods.
Better selectivity between different materials
Back